The Journal of Applied Remote Sensing is a peer-reviewed open access scientific journal published by SPIE. It covers all aspects of remote sensing and was established in 2007. The editor-in-chief is Ni-Bin Chang (University of Central Florida).
This journal is indexed by the following databases:
According to the Journal Citation Reports, the journal has a 2020 impact factor of 1.53.
"Journal of Applied Remote Sensing". 2019 Journal Citation Reports. Web of Science (Science ed.). Thomson Reuters. 2020.