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Journal of Applied Remote Sensing

The Journal of Applied Remote Sensing is a peer-reviewed open access scientific journal published by SPIE. It covers all aspects of remote sensing and was established in 2007. The editor-in-chief is Ni-Bin Chang (University of Central Florida).

Abstracting and indexing

This journal is indexed by the following databases:

According to the Journal Citation Reports, the journal has a 2020 impact factor of 1.53.

See also

"Journal of Applied Remote Sensing". 2019 Journal Citation Reports. Web of Science (Science ed.). Thomson Reuters. 2020.

References

External links