Gallium(III) oxide is an inorganic compound with the formula Ga<sub>2</sub>O<sub>3</sub>. An ultra-wide-bandgap semiconductor, it has been studied for applications in power electronics, phosphors, and gas sensing. The compound has several polymorphs, of which the monoclinic ò-phase is the most stable.
Hydrated gallium trioxide precipitated upon neutralization of acidic or basic solution of gallium salt. Also, it is formed on heating gallium in air or by thermally decomposing gallium nitrate at 200âÂÂ250 ðC.
Crystalline Ga<sub>2</sub>O<sub>3</sub> occur in five polymorphs, ñ, ò, ó, ô, and õ. Of these polymorphs ò-Ga<sub>2</sub>O<sub>3</sub> is the most thermodynamically stable phase at standard temperature and pressure while ñ-Ga<sub>2</sub>O<sub>3</sub> is the most stable polymorph under high pressures.
Bulk substrates of ò-Ga<sub>2</sub>O<sub>3</sub> can be produced, which is one of the major advantages of this material system. Bulk substrates can be produced in multiple orientations and by multiple techniques.
Gallium(III) trioxide is amphoteric. It reacts with alkali metal oxides at high temperature to form, e.g., NaGaO<sub>2</sub>, and with Mg, Zn, Co, Ni, Cu oxides to form spinels, e.g., MgGa<sub>2</sub>O<sub>4</sub>. It dissolves in strong alkali to form a solution of the gallate ion, .
With HCl, it forms gallium trichloride GaCl<sub>3</sub>.
It can be reduced to gallium suboxide (gallium(I) oxide) Ga<sub>2</sub>O by H<sub>2</sub>. or by reaction with gallium metal:
ò-Ga<sub>2</sub>O<sub>3</sub>, with a melting point of 1900 ðC, is the most stable crystalline modification. The oxide ions are in a distorted cubic closest packing arrangement, and the gallium (III) ions occupy distorted tetrahedral and octahedral sites, with GaâÂÂO bond distances of 1.83 and 2.00 àrespectively.
ñ-Ga<sub>2</sub>O<sub>3</sub> has the same structure (corundum) as ñ-Al<sub>2</sub>O<sub>3</sub>, wherein Ga ions are 6-coordinate.
ó-Ga<sub>2</sub>O<sub>3</sub> has a defect spinel structure similar to that of ó-Al<sub>2</sub>O<sub>3</sub>.
õ-Ga<sub>2</sub>O<sub>3</sub> films deposited by metalorganic vapour-phase epitaxy show a columnar structure with orthorhombic crystal symmetry. Macroscopically, this structure is seen by X-ray crystallography as hexagonal close packed.
ú-Ga<sub>2</sub>O<sub>3</sub> has an orthorhombic structure and forms with 120ð twin domains, resulting in hexagonal symmetry which is often identified as õ-Ga<sub>2</sub>O<sub>3</sub>.
ò-Ga<sub>2</sub>O<sub>3</sub> can also form alloys with alumina to yield ò-(Al<sub>x</sub>Ga<sub>1-x</sub>)O<sub>3.</sub> This alloy can be used to form heterostructures and create a two-dimensional electron gas (2DEG).
The ò-phase's bandgap of 4.7âÂÂ4.9 eV and large-area, native substrates make it a potential competitor to GaN and SiC-based power electronics applications and solar-blind UV photodetectors. The orthorhombic ø-Ga<sub>2</sub>O<sub>3</sub> is the second most stable polymorph. The ø-phase has shown instability of subsurface doping density under thermal exposure. Ga<sub>2</sub>O<sub>3</sub> exhibits reduced thermal conductivity and electron mobility by an order of magnitude compared to GaN and SiC, but is predicted to be significantly more cost-effective due to being the only wide-bandgap material capable of being grown from melt. ò-Ga<sub>2</sub>O<sub>3</sub> is thought to be radiation-hard, which makes it promising for military and space applications. Gallium(III) oxide has been studied for usage as passive components in lasers, phosphors, and luminescent materials as well as active components for gas sensors, power diodes, and power transistors. Since the first publication in January 2012 by the National Institute of Information and Communications Technology, in collaboration with Tamura Co., Ltd. and Koha Co., Ltd. of the world's first single-crystal gallium oxide (Ga<sub>2</sub>O<sub>3</sub>) field-effect transistors, the predominant interest in gallium oxide is in the ò-polymorph for power electronics.
Monoclinic ò-Ga<sub>2</sub>O<sub>3</sub> has been compared with GaN- and SiC-based power devices. ò-Ga<sub>2</sub>O<sub>3</sub> Schottky diodes have exceeded breakdown voltages of 2400 V. ò-Ga<sub>2</sub>O<sub>3</sub>/NiO<sub>x</sub> pâÂÂn diodes have exhibited breakdown voltages over 1200 V. ò-Ga<sub>2</sub>O<sub>3</sub> MOSFETs have individually achieved figures of merits of àf<sub>T</sub> of 27 GHz, f<sub>MAX</sub> of 48 GHz, and 5.4 MV/cm average breakdown field. This field exceeds that which is possible in SiC or GaN.
õ-Ga<sub>2</sub>O<sub>3</sub> thin films deposited on sapphire have been investigated as solar-blind UV photodetector.